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Journal of Environmental Nanotechnology

(A Quarterly Peer-reviewed and Refereed International Journal)
ISSN(Print):2279-07 48; ISSN(Online):2319-5541
CODEN:JENOE2

An Effective Automatic Fabric Defect Detection System using Digital Image Processing

Abstract

For a long time fabric defect detection is carried out manually with human visual inspection. Automatic fabric inspection is important to maintain the quality of fabric. Fabric analysis is performed on the basis of digital images of the fabric. The recognizer acquires digital fabric images by image acquisition device and sends it to a computer system to processes the received image. The computer system makes a fabric analysis to find out whether the fabric is defect free or defected using Digital image processing techniques. In spite of innumerable algorithms available, the research is still challenging one. This paper presents the need, challenges and the processes of automatic fabric defect detection system. And more over the paper presents all the possible available technologies involved in the automatic fabric defect detection system.

Article Type: Research Article

Corresponding Author: G. M. Nasira 2  

Email: nasiragm99@yahoo.com

This article has not yet been cited.

S. Sahaya Tamil Selvi 1,  G. M. Nasira 2*.  

1. Department of Computer Science, Chikkanna Govt. Arts College, Tiruppur, TN, India.

2. Department of Computer Applications, Chikkanna Govt. Arts College, Tirupur, TN, India.

J. Environ. Nanotechnol., Volume 6, No. 1 pp. 79-85
ISSN: 2279-0748 eISSN: 2319-5541
ENT171241.pdf
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Reference

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