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Journal of Environmental Nanotechnology

(A Quarterly Peer-reviewed and Refereed International Journal)
ISSN(Print):2279-07 48; ISSN(Online):2319-5541

Optical Analysis of ZnO Thin Films by SILAR Method


Zinc oxide (ZnO) thin films were grown on glass substrate by the Successive Ionic Layer Adsorption and Reaction (SILAR) technique. The structural, morphological surface and optical properties of the films have been studied by using X-ray diffraction (XRD), scanning electron microscopy (SEM) and UV-VIS-spectrophotometer. Effects of experimental parameters on the structural and optical properties were discussed. The X ray diffraction analysis shows that the films are polycrystalline with zincite hexagonal structure. The study of surface morphology reveals that deposited ZnO films the film contains the grains in the form of flakes and further magnification the flakes can be viewed as flower like morphology. Obtained ZnO films exhibit a moderately high transmittance in visible band, and optical band gap of 3.2 eV which can be applicable for photovoltaic applications..

Article Type: Research Article

Corresponding Author: M. Nirmala 1  

Email: saicharan.kumar16@gmail.com

This article has not yet been cited.

M. Nirmala 1*,  B. Kavitha 2,  L. Iswarya 3,  A. Firose Banu 4.  

1, 2, 3, 4. Department of Physics, Sri GVG Visalakshi College for Women, S.V Mills post, Udumalpet, TN, India.

J. Environ. Nanotechnol., Volume 6, No. 4 pp. 36-41
ISSN: 2279-0748 eISSN: 2319-5541
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